Journal: IEEE Trans. Contr. Sys. Techn.

Volume 5, Issue 6

529 -- 541Yunosuke Maki, Kenneth A. Loparo. A neural-network approach to fault detection and diagnosis in industrial processes
542 -- 555Youbin Peng, Abdelillah Youssouf, Philippe Arte, Michel Kinnaert. A complete procedure for residual generation and evaluation with application to a heat exchanger
556 -- 570H. Geniele, Rajni V. Patel, Khashayar Khorasani. End-point control of a flexible-link manipulator: theory and experiments
571 -- 585A. P. Kjaer, Peter E. Wellstead, William P. Heath. On-line sensing of paper machine wet-end properties: dry-line detector
586 -- 597Chi-haur Wu, Kao-Shing Hwang, Shih-Lang Chang. Analysis and implementation of a neuromuscular-like control for robotic compliance
598 -- 613Fathi M. A. Salam, Christian Piwek, Gamze Erten, Timothy A. Grotjohn, Jes Asmussen. Modeling of a plasma processing machine for semiconductor wafer etching using energy-functions-based neural networks
614 -- 628Perry Y. Li, Luis Mejias Alvarez, Roberto Horowitz. AHS safe control laws for platoon leaders
629 -- 643David L. Pepyne, Christos G. Cassandras. Optimal dispatching control for elevator systems during uppeak traffic
644 -- 653Young Man Cho, Paul Gyugyi. Control of rapid thermal processing: a system theoretic approach
654 -- 661Pamela T. Bhatti, Blake Hannaford. Single-chip velocity measurement system for incremental optical encoders