Journal: IEEE T. Instrumentation and Measurement

Volume 54, Issue 3

941 -- 955Sunil R. Das. Getting errors to catch themselves - self-testing of VLSI circuits with built-in hardware
956 -- 964Douglas Kay, Sung Chung, Samiha Mourad. Embedded test control schemes using iBIST for SOCs
965 -- 974Jacob Savir. Built-in online and offline test of airborne digital systems
975 -- 987Karen Taylor, Bryan Nelson, Alan Chong, Henry C. Lin, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz. Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement
988 -- 995An Sang Hou. A built-in-test scheme for evaluating the parameters of floating-gate MOS transistors
996 -- 1002Chun-Lung Hsu, Yi-Ting Lai, Shu-Wei Wang. Built-in self-test for phase-locked loops
1003 -- 1018John W. Sheppard, Mark A. Kaufman. A Bayesian approach to diagnosis and prognosis using built-in test
1019 -- 1024Adam Josko, Remigiusz J. Rak. Effective simulation of signals for testing ECG analyzer
1025 -- 1032Massimo Aiello, Antonio Cataliotti, Salvatore Nuccio. A chirp-z transform-based synchronizer for power system measurements
1033 -- 1044Cesare Alippi, Marcantonio Catelani, Ada Fort, Marco Mugnaini. Automated selection of test frequencies for fault diagnosis in analog electronic circuits
1045 -- 1053Bruno Ando, Salvatore Graziani, Nicola Pitrone. Characterization of threshold-induced phenomena in deterministic driven devices
1054 -- 1060Bruno Ando, Salvatore Graziani. Basic measurements for the characterization of ferroelectric devices
1061 -- 1066Gregorio Andria, Giuseppe Cavone, Vincenzo Di Lecce, Anna Maria Lucia Lanzolla. Model characterization in measurements of environmental pollutants via data correlation of sensor outputs
1073 -- 1078Harrish Chandr Bheemul, Gang Lu, Yong Yan. Digital imaging-based three-dimensional characterization of flame front structures in a turbulent flame
1079 -- 1088Stephen Bull, Alexander V. Andrianov, Ian Harrison, Michael Dorin, Robert B. Kerr, John Noto, Eric C. Larkins. A spectroscopically resolved photo- and electroluminescence microscopy technique for the study of high-power and high-brightness laser diodes
1089 -- 1099Chien-In Henry Chen, Kiran George, William McCormick, James B. Y. Tsui, Stephen L. Hary, Keith M. Graves. Design and performance evaluation of a 2.5-GSPS digital receiver
1100 -- 1110Zhi Ning Chen, Ning Yang, Yong-Xin Guo, Michael Yan Wah Chia. An investigation into measurement of handset antennas
1111 -- 1117Marco Chirico, Anna Marina Scapolla, Andrea Bagnasco. A new and open model to share laboratories on the Internet
1118 -- 1125Fjo De Ridder, Rik Pintelon, Johan Schoukens, Anouk Verheyden. Reduction of the Gibbs phenomenon applied on nonharmonic time base distortions
1133 -- 1143Tibor Fabian, Fritz B. Prinz, Georg Brasseur. Capacitive sensor for active tip clearance control in a palm-sized gas turbine generator
1144 -- 1149George C. Giakos, N. Shah, Samir Chowdhury, Sankararaman Suryanarayanan, S. Sumrain, R. Guntupalli, A. Medithe, Srinivasan Vedantham, V. Kumar, R. E. Endorf. An efficient, novel microstrip collector architecture for digital radiographic imaging CZT semiconductor sensors
1150 -- 1155Vladimír Haasz, Jaroslav Roztocil, David Slepicka. Evaluation of ADC testing systems using ADC transfer standard
1156 -- 1165Wei-Da Hao, Yih-Chyun Jenq, Shiang-Yu Wang. Ratio indicator characterization for measuring the precision of an estimate obtained by processing sampled data
1166 -- 1170Chang-Hwan Im, Hyun-Kyo Jung. Numerical emulator for walk-through metal detectors using 3-D indirect boundary integral equation method
1171 -- 1174Boguslaw J. Jarosz, Sara St James. Integrated temperature sensor for determination of ultrasound interstitial applicator heating effects
1180 -- 1187Yih-Chyun Jenq, Lerong Cheng. Digital spectrum of a nonuniformly sampled two-dimensional signal and its reconstruction
1188 -- 1199Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger. Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal
1200 -- 1208Amor Jnifene, William Andrews. Experimental study on active vibration control of a single-link flexible manipulator using tools of fuzzy logic and neural networks
1209 -- 1213Harald Klingbeil. A fast DSP-based phase-detector for closed-loop RF control in synchrotrons
1214 -- 1218Christian Lauer, Stefan Szalay, Gerhard Böhm, Chun Lin, Fabian Köhler, Markus-Christian Amann. Laser hygrometer using a vertical-cavity surface-emitting laser (VCSEL) with an emission wavelength of 1.84 μm
1227 -- 1234A. Murari, L. Lotto, S. Costa, I. Molon. In situ measurement of Open Window electron multipliers gain
1235 -- 1240Tomas Olofsson. Deconvolution and model-based restoration of clipped ultrasonic signals
1241 -- 1248Noh-Jin Park, K. M. George, Nohpill Park, Minsu Choi, Yong-Bin Kim, Fabrizio Lombardi. Environmental-based characterization of SoC-based instrumentation systems for stratified testing
1249 -- 1253Henrique Jorge Quaresma, Antonio Pedro Silva, Antonio M. Cruz Serra. Error correction technique for dynamic impedance measurement
1254 -- 1259Fernando Rangel de Sousa, Bernard Huyart, Sebastian Yuri Cavalcanti Catunda. A-to-D converter and lookup table dimensioning for six- or five-port phase discriminators
1260 -- 1265Luis Alexandre Rocha, Edmond Cretu, Reinoud F. Wolffenbuttel. MEMS-based mechanical spectrum analyzer
1266 -- 1273Florence Sagnard, Faroudja Bentabet, Christophe Vignat. In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I)
1274 -- 1282Florence Sagnard, Faroudja Bentabet, Christophe Vignat. In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: experiments (Part II)
1283 -- 1295Mehmet Sahinoglu, David L. Libby, Sunil R. Das. Measuring availability indexes with small samples for component and network reliability using the Sahinoglu-Libby probability model
1296 -- 1302Edval J. P. Santos, Anatoly A. Barybin. Stepped-waveform synthesis for reducing third harmonic content
1303 -- 1312Roar Skartlien, Leiv Øyehaug. Quantization error and resolution in ensemble averaged data with noise
1313 -- 1320Michael Solomou, David Rees. Frequency domain analysis of nonlinear distortions on linear frequency response function measurements
1321 -- 1326Yanfeng Wang, Makoto Nishikawa, Ryuichi Maeda, Masaichi Fukunaga, Kenzo Watanabe. A smart thermal environment monitor based on IEEE 1451.2 standard for global networking
1327 -- 1332Mark H. Weatherspoon, Lawrence P. Dunleavy. Vector corrected on-wafer measurements of noise temperature
1333 -- 1341Xiaoli Yang, Dorina C. Petriu, Thomas E. Whalen, Emil M. Petriu. Hierarchical animation control of avatars in 3-D virtual environments