Triple Patterning Lithography Aware Optimization and Detailed Placement Algorithms for Standard Cell-Based Designs

Jian Kuang 0001, Wing-Kai Chow, Evangeline F. Y. Young. Triple Patterning Lithography Aware Optimization and Detailed Placement Algorithms for Standard Cell-Based Designs. IEEE Trans. VLSI Syst., 24(4):1319-1332, 2016. [doi]

Abstract

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