Skip-scan: A methodology for test time reduction

Binod Kumar 0001, Boda Nehru, Brajesh Pandey, Jaynarayan T. Tudu. Skip-scan: A methodology for test time reduction. In 20th International Symposium on VLSI Design and Test, VDAT 2016, Guwahati, India, May 24-27, 2016. pages 1-6, IEEE, 2016. [doi]

Authors

Binod Kumar 0001

This author has not been identified. Look up 'Binod Kumar 0001' in Google

Boda Nehru

This author has not been identified. Look up 'Boda Nehru' in Google

Brajesh Pandey

This author has not been identified. Look up 'Brajesh Pandey' in Google

Jaynarayan T. Tudu

This author has not been identified. Look up 'Jaynarayan T. Tudu' in Google