High precision optical angle measuring method applicable in standard CMOS technology - researchr publication authors

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Christian Koch 0004, Jürgen Oehm, Andreas Gornik. High precision optical angle measuring method applicable in standard CMOS technology. In 35th European Solid-State Circuits Conference, ESSCIRC 2009, Athens, Greece, 14-18 September 2009. pages 244-247, IEEE, 2009. [doi]

This author has not been identified. Look up 'Christian Koch 0004' in GoogleThis author has not been identified. Look up 'Jürgen Oehm' in GoogleThis author has not been identified. Look up 'Andreas Gornik' in Google

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