Christian Koch 0004, Jürgen Oehm, Andreas Gornik. High precision optical angle measuring method applicable in standard CMOS technology. In 35th European Solid-State Circuits Conference, ESSCIRC 2009, Athens, Greece, 14-18 September 2009. pages 244-247, IEEE, 2009. [doi]
@inproceedings{0004OG09, title = {High precision optical angle measuring method applicable in standard CMOS technology}, author = {Christian Koch 0004 and Jürgen Oehm and Andreas Gornik}, year = {2009}, doi = {10.1109/ESSCIRC.2009.5325982}, url = {https://doi.org/10.1109/ESSCIRC.2009.5325982}, researchr = {https://researchr.org/publication/0004OG09}, cites = {0}, citedby = {0}, pages = {244-247}, booktitle = {35th European Solid-State Circuits Conference, ESSCIRC 2009, Athens, Greece, 14-18 September 2009}, publisher = {IEEE}, isbn = {978-1-4244-4354-3}, }