Characterizing 3D Charge Trap NAND Flash: Observations, Analyses and Applications - researchr publication authors

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Fei Wu 0005, Yue Zhu, Qin Xiong, Zhonghai Lu, You Zhou, Weizhen Kong, Changsheng Xie. Characterizing 3D Charge Trap NAND Flash: Observations, Analyses and Applications. In 36th IEEE International Conference on Computer Design, ICCD 2018, Orlando, FL, USA, October 7-10, 2018. pages 381-388, IEEE, 2018. [doi]

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