Fei Wu 0005, Yue Zhu, Qin Xiong, Zhonghai Lu, You Zhou, Weizhen Kong, Changsheng Xie. Characterizing 3D Charge Trap NAND Flash: Observations, Analyses and Applications. In 36th IEEE International Conference on Computer Design, ICCD 2018, Orlando, FL, USA, October 7-10, 2018. pages 381-388, IEEE, 2018. [doi]
@inproceedings{0005ZXLZKX18,
title = {Characterizing 3D Charge Trap NAND Flash: Observations, Analyses and Applications},
author = {Fei Wu 0005 and Yue Zhu and Qin Xiong and Zhonghai Lu and You Zhou and Weizhen Kong and Changsheng Xie},
year = {2018},
doi = {10.1109/ICCD.2018.00064},
url = {https://doi.org/10.1109/ICCD.2018.00064},
researchr = {https://researchr.org/publication/0005ZXLZKX18},
cites = {0},
citedby = {0},
pages = {381-388},
booktitle = {36th IEEE International Conference on Computer Design, ICCD 2018, Orlando, FL, USA, October 7-10, 2018},
publisher = {IEEE},
isbn = {978-1-5386-8477-1},
}