Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal. Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. In Leon Stok, Nikil D. Dutt, Soha Hassoun, editors, Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011. pages 534-539, ACM, 2011. [doi]
@inproceedings{AarestadLPAA11,
title = {Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect},
author = {Jim Aarestad and Charles Lamech and Jim Plusquellic and Dhruva Acharyya and Kanak Agarwal},
year = {2011},
doi = {10.1145/2024724.2024848},
url = {http://doi.acm.org/10.1145/2024724.2024848},
researchr = {https://researchr.org/publication/AarestadLPAA11},
cites = {0},
citedby = {0},
pages = {534-539},
booktitle = {Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011},
editor = {Leon Stok and Nikil D. Dutt and Soha Hassoun},
publisher = {ACM},
isbn = {978-1-4503-0636-2},
}