Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal. Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. In Leon Stok, Nikil D. Dutt, Soha Hassoun, editors, Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011. pages 534-539, ACM, 2011. [doi]
Abstract is missing.