One-Pass Redundancy Identification and Removal

Miron Abramovici, Mahesh A. Iyer. One-Pass Redundancy Identification and Removal. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 807-815, IEEE Computer Society, 1992.

Abstract

Abstract is missing.