SMART and FAST: Test Generation for VLSI Scan-Design Circuits - researchr publication authors

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Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller. SMART and FAST: Test Generation for VLSI Scan-Design Circuits. IEEE Design & Test of Computers, 3(4):43-54, 1986. [doi]

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