Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller. SMART and FAST: Test Generation for VLSI Scan-Design Circuits. IEEE Design & Test of Computers, 3(4):43-54, 1986. [doi]
@article{AbramoviciKMM86,
title = {SMART and FAST: Test Generation for VLSI Scan-Design Circuits},
author = {Miron Abramovici and James J. Kulikowski and Premachandran R. Menon and David T. Miller},
year = {1986},
doi = {10.1109/MDT.1986.294975},
url = {https://doi.org/10.1109/MDT.1986.294975},
researchr = {https://researchr.org/publication/AbramoviciKMM86},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {3},
number = {4},
pages = {43-54},
}