Hari Addepalli, Irith Pomeranz, M. Enamul Amyeen, Suriyaprakash Natarajan, Arani Sinha, Srikanth Venkataraman. Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults. In IEEE 31st Asian Test Symposium, ATS 2022, Taichung City, Taiwan, November 21-24, 2022. pages 120-125, IEEE, 2022. [doi]
Abstract is missing.