Hari Addepalli, Jiezhong Wu, Nilanjan Mukherjee 0001, Irith Pomeranz, Janusz Rajski. Delay Monitoring Under Different PVT Corners for Test and Functional Operation. In IEEE International Test Conference, ITC 2024, San Diego, CA, USA, November 3-8, 2024. pages 157-166, IEEE, 2024. [doi]
Abstract is missing.