Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations - researchr publication authors

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Amit Agarwal, Kunhyuk Kang, Kaushik Roy. Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 736-741, IEEE Computer Society, 2005.

This author has not been identified. Look up 'Amit Agarwal' in GoogleThis author has not been identified. Look up 'Kunhyuk Kang' in GoogleThis author has not been identified. Look up 'Kaushik Roy' in Google

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