Amit Agarwal, Kunhyuk Kang, Kaushik Roy. Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations. In 2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA. pages 736-741, IEEE Computer Society, 2005.
@inproceedings{AgarwalKR05,
title = {Accurate estimation and modeling of total chip leakage considering inter- & intra-die process variations},
author = {Amit Agarwal and Kunhyuk Kang and Kaushik Roy},
year = {2005},
tags = {modeling, process modeling},
researchr = {https://researchr.org/publication/AgarwalKR05},
cites = {0},
citedby = {0},
pages = {736-741},
booktitle = {2005 International Conference on Computer-Aided Design (ICCAD 05), November 6-10, 2005, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-9254-X},
}