Kanak Agarwal, Sani R. Nassif. The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. IEEE Trans. VLSI Syst., 16(1):86-97, 2008. [doi]
@article{AgarwalN08,
title = {The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies},
author = {Kanak Agarwal and Sani R. Nassif},
year = {2008},
doi = {10.1109/TVLSI.2007.909792},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2007.909792},
researchr = {https://researchr.org/publication/AgarwalN08},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {16},
number = {1},
pages = {86-97},
}