The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies - researchr publication references

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Kanak Agarwal, Sani R. Nassif. The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. IEEE Trans. VLSI Syst., 16(1):86-97, 2008. [doi]

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