Mukesh Agrawal, Krishnendu Chakrabarty, Randy Widialaksono. Reuse-Based Optimization for Prebond and Post-Bond Testing of 3-D-Stacked ICs. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(1):122-135, 2015. [doi]
@article{AgrawalCW15,
title = {Reuse-Based Optimization for Prebond and Post-Bond Testing of 3-D-Stacked ICs},
author = {Mukesh Agrawal and Krishnendu Chakrabarty and Randy Widialaksono},
year = {2015},
doi = {10.1109/TCAD.2014.2369747},
url = {http://dx.doi.org/10.1109/TCAD.2014.2369747},
researchr = {https://researchr.org/publication/AgrawalCW15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {34},
number = {1},
pages = {122-135},
}