Analog/RF test ordering in the early stages of production testing

Nourredine Akkouche, Salvador Mir, Emmanuel Simeu, Mustapha Slamani. Analog/RF test ordering in the early stages of production testing. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 25-30, IEEE, 2012. [doi]

Authors

Nourredine Akkouche

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Salvador Mir

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Emmanuel Simeu

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Mustapha Slamani

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