Nourredine Akkouche, Salvador Mir, Emmanuel Simeu, Mustapha Slamani. Analog/RF test ordering in the early stages of production testing. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 25-30, IEEE, 2012. [doi]
@inproceedings{AkkoucheMSS12,
title = {Analog/RF test ordering in the early stages of production testing},
author = {Nourredine Akkouche and Salvador Mir and Emmanuel Simeu and Mustapha Slamani},
year = {2012},
doi = {10.1109/VTS.2012.6231075},
url = {http://dx.doi.org/10.1109/VTS.2012.6231075},
researchr = {https://researchr.org/publication/AkkoucheMSS12},
cites = {0},
citedby = {0},
pages = {25-30},
booktitle = {30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012},
publisher = {IEEE},
isbn = {978-1-4673-1074-1},
}