On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology - researchr publication authors

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Chouki Aktouf, Benoît Pannetier, Pierre Lemaître-Auger, Smail Tedjini. On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 191, IEEE Computer Society, 2002. [doi]

This author has not been identified. Look up 'Chouki Aktouf' in GoogleThis author has not been identified. Look up 'Benoît Pannetier' in GoogleThis author has not been identified. Look up 'Pierre Lemaître-Auger' in GoogleThis author has not been identified. Look up 'Smail Tedjini' in Google

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