Chouki Aktouf, Benoît Pannetier, Pierre Lemaître-Auger, Smail Tedjini. On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 191, IEEE Computer Society, 2002. [doi]
Abstract is missing.