Chouki Aktouf, Benoît Pannetier, Pierre Lemaître-Auger, Smail Tedjini. On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 191, IEEE Computer Society, 2002. [doi]
@inproceedings{AktoufPLT02,
title = {On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology},
author = {Chouki Aktouf and Benoît Pannetier and Pierre Lemaître-Auger and Smail Tedjini},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/ioltw/2002/1641/00/16410191.pdf},
tags = {modeling, testing},
researchr = {https://researchr.org/publication/AktoufPLT02},
cites = {0},
citedby = {0},
pages = {191},
booktitle = {8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1641-6},
}