Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs

Zaid Al-Ars, Said Hamdioui, A. J. van de Goor, Sultan M. Al-Harbi. Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(12):2989-2996, 2006. [doi]

Authors

Zaid Al-Ars

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Said Hamdioui

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A. J. van de Goor

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Sultan M. Al-Harbi

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