Zaid Al-Ars, Said Hamdioui, A. J. van de Goor, Sultan M. Al-Harbi. Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(12):2989-2996, 2006. [doi]
@article{Al-ArsHGA06,
title = {Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs},
author = {Zaid Al-Ars and Said Hamdioui and A. J. van de Goor and Sultan M. Al-Harbi},
year = {2006},
doi = {10.1109/TCAD.2006.882492},
url = {http://dx.doi.org/10.1109/TCAD.2006.882492},
researchr = {https://researchr.org/publication/Al-ArsHGA06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {12},
pages = {2989-2996},
}