Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs

Zaid Al-Ars, Said Hamdioui, A. J. van de Goor, Sultan M. Al-Harbi. Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(12):2989-2996, 2006. [doi]

Abstract

Abstract is missing.