Hussain Al-Asaad, John P. Hayes. Design verification via simulation and automatic test pattern generation. In Richard L. Rudell, editor, Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995, San Jose, California, USA, November 5-9, 1995. pages 174-180, IEEE Computer Society, 1995. [doi]
Abstract is missing.