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Dhamin Al-Khalili, Come Rozon, B. Stewart. Testability analysis and fault modeling of BiCMOS circuits. J. Electronic Testing, 3(3):207-217, 1992. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS CircuitsMichael Ogbonna Esonu, Dhamin Al-Khalili, Come Rozon. iscas 1993: 1714-1717 Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS CircuitsMichael Ogbonna Esonu, Dhamin Al-Khalili, Côme Rozon. vlsi, 1(4):261-276, 1994. [doi]
The following publications are possibly variants of this publication: