Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey. Bist Reseeding with very few Seeds. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 69-76, IEEE Computer Society, 2003. [doi]
Abstract is missing.