An Optimum ORA BIST for Multiple Fault FPGA Look-Up Table Testing - researchr publication

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Armin Alaghi, Mahnaz Sadoughi Yarandi, Zainalabedin Navabi. An Optimum ORA BIST for Multiple Fault FPGA Look-Up Table Testing. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 293-298, IEEE, 2006. [doi]

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