A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits - researchr publication authors

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Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler. A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 415-421, IEEE Computer Society, 1992.

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