Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler. A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 415-421, IEEE Computer Society, 1992.
@inproceedings{AlaniMA92,
title = {A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits},
author = {Alaa F. Alani and Gerry Musgrave and Anthony P. Ambler},
year = {1992},
tags = {testing},
researchr = {https://researchr.org/publication/AlaniMA92},
cites = {0},
citedby = {0},
pages = {415-421},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}