New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. In 27th IEEE North Atlantic Test Workshop, NATW 2018, Essex, VT, USA, May 7-9, 2018. pages 1-8, IEEE, 2018. [doi]

This author has not been identified. Look up 'Nabil El Belghiti Alaoui' in GoogleThis author has not been identified. Look up 'Patrick Tounsi' in GoogleThis author has not been identified. Look up 'Alexandre Boyer' in GoogleThis author has not been identified. Look up 'Arnaud Viard' in Google

runs on WebDSL