Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. In 27th IEEE North Atlantic Test Workshop, NATW 2018, Essex, VT, USA, May 7-9, 2018. pages 1-8, IEEE, 2018. [doi]
@inproceedings{AlaouiTBV18,
title = {New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs},
author = {Nabil El Belghiti Alaoui and Patrick Tounsi and Alexandre Boyer and Arnaud Viard},
year = {2018},
doi = {10.1109/NATW.2018.8388867},
url = {https://doi.org/10.1109/NATW.2018.8388867},
researchr = {https://researchr.org/publication/AlaouiTBV18},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {27th IEEE North Atlantic Test Workshop, NATW 2018, Essex, VT, USA, May 7-9, 2018},
publisher = {IEEE},
isbn = {978-1-5386-6400-1},
}