Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. In 27th IEEE North Atlantic Test Workshop, NATW 2018, Essex, VT, USA, May 7-9, 2018. pages 1-8, IEEE, 2018. [doi]
Abstract is missing.