Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin. Virtual reconfigurable scan-chains on FPGAs for optimized board test. In 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta, Mexico, March 25-27, 2015. pages 1-6, IEEE, 2015. [doi]
Abstract is missing.