Detecting a trojan die in 3D stacked integrated circuits - researchr publication authors

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Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch. Detecting a trojan die in 3D stacked integrated circuits. In 2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017. pages 1-6, IEEE, 2017. [doi]

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