Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch. Detecting a trojan die in 3D stacked integrated circuits. In 2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{AlhelalyDMGNC17,
title = {Detecting a trojan die in 3D stacked integrated circuits},
author = {Soha Alhelaly and Jennifer Dworak and Theodore W. Manikas and Ping Gui and Kundan Nepal and Alfred L. Crouch},
year = {2017},
doi = {10.1109/NATW.2017.7938027},
url = {https://doi.org/10.1109/NATW.2017.7938027},
researchr = {https://researchr.org/publication/AlhelalyDMGNC17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2017 IEEE North Atlantic Test Workshop, NATW 2017, Providence, RI, USA, May 8-10, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5902-7},
}