Test power reduction via deterministic alignment of stimulus and response bits - researchr publication authors

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Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu. Test power reduction via deterministic alignment of stimulus and response bits. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]

This author has not been identified. Look up 'Sobeeh Almukhaizim' in GoogleThis author has not been identified. Look up 'Eman AlQuraishi' in GoogleThis author has not been identified. Look up 'Ozgur Sinanoglu' in Google

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