Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu. Test power reduction via deterministic alignment of stimulus and response bits. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]
Abstract is missing.