Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu. Test power reduction via deterministic alignment of stimulus and response bits. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-6, IEEE, 2011. [doi]
@inproceedings{AlmukhaizimAS11-0,
title = {Test power reduction via deterministic alignment of stimulus and response bits},
author = {Sobeeh Almukhaizim and Eman AlQuraishi and Ozgur Sinanoglu},
year = {2011},
doi = {10.1109/LATW.2011.5985911},
url = {https://doi.org/10.1109/LATW.2011.5985911},
researchr = {https://researchr.org/publication/AlmukhaizimAS11-0},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1490-0},
}