PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices

Dawood Alnajiar, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye. PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices. IEICE Electronic Express, 10(5):20130081, 2013. [doi]

Authors

Dawood Alnajiar

This author has not been identified. Look up 'Dawood Alnajiar' in Google

Yukio Mitsuyama

This author has not been identified. Look up 'Yukio Mitsuyama' in Google

Masanori Hashimoto

This author has not been identified. Look up 'Masanori Hashimoto' in Google

Takao Onoye

This author has not been identified. Look up 'Takao Onoye' in Google