PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices

Dawood Alnajiar, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye. PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices. IEICE Electronic Express, 10(5):20130081, 2013. [doi]

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