Dawood Alnajiar, Yukio Mitsuyama, Masanori Hashimoto, Takao Onoye. PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices. IEICE Electronic Express, 10(5):20130081, 2013. [doi]
@article{AlnajjarMHO13,
title = {PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices},
author = {Dawood Alnajiar and Yukio Mitsuyama and Masanori Hashimoto and Takao Onoye},
year = {2013},
doi = {10.1587/elex.10.20130081},
url = {http://dx.doi.org/10.1587/elex.10.20130081},
researchr = {https://researchr.org/publication/AlnajjarMHO13},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {10},
number = {5},
pages = {20130081},
}