Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel. NIM- a noise index model to estimate delay discrepancies between silicon and simulation. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1373-1376, IEEE, 2010. [doi]
Abstract is missing.