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Atlaf Ul Amin, Satoshi Ohtake, Hideo Fujiwara. Design for Two-Pattern Testability of Controller-Data Path Circuits. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 73-79, IEEE Computer Society, 2002. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Design for Hierarchical Two-Pattern Testability of Data PathsMd. Altaf-Ul-Amin, Satoshi Ohtake, Hideo Fujiwara. ats 2001: 11-16 [doi] Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict AnalysisDong Xiang, Shan Gu, Hideo Fujiwara. ats 2003: 300-305 [doi]
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