Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana. Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 124-130, IEEE Computer Society, 2001. [doi]
Abstract is missing.