Rohit Ananthakrishna, Shabbir H. Batterywala. MoM - A Process Variation Aware Statistical Capacitance Extractor. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 135-140, IEEE Computer Society, 2006. [doi]
@inproceedings{AnanthakrishnaB06,
title = {MoM - A Process Variation Aware Statistical Capacitance Extractor},
author = {Rohit Ananthakrishna and Shabbir H. Batterywala},
year = {2006},
doi = {10.1109/VLSID.2006.119},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.119},
tags = {context-aware},
researchr = {https://researchr.org/publication/AnanthakrishnaB06},
cites = {0},
citedby = {0},
pages = {135-140},
booktitle = {19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2502-4},
}